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Ferroelectric-Gate Field Effect Transistor Memories by Byung-Eun Park — OmList
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F
erroelectric-Gate Field Effect Transistor Memories
by
Byung-Eun Park
,
Hiroshi Ishiwara
,
Masanori Okuyama
,
Shigeki Sakai
,
Sung-Min Yoon
“Device Physics and Applications”
2016
402 pages
~7½h read
‹
only cover on file
›
F
erroelectric-Gate Field Effect Transistor Memories
by
Byung-Eun Park
,
Hiroshi Ishiwara
,
Masanori Okuyama
,
Shigeki Sakai
,
Sung-Min Yoon
“Device Physics and Applications”
2016
402 pages
~7½h read
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§ Details
the particulars
Author
Byung-Eun Park, Hiroshi Ishiwara, Masanori Okuyama, Shigeki Sakai, Sung-Min Yoon
Published
2016
Pages
402
Language
ENG
ISBN
9789402408416
§ Where to read
1 ways
O
Open Library
info
Details
❦
First published 2016
402 pages · in English
№ 799854
9789402408416
~ the end ~